TIME1150 Ultrasonic Flaw Detector

TIME1150 Ultrasonic Flaw Detector


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Rp. 128.666.240

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Description

Ultrasonic Flaw Detector TIME®1150


Feature

Features

  •  5.7 inch, VGA color TFT display and LEMO/BNC probe connector.
  • Wide measurement range from 1-10000 mm.
  • Precise and stable horizontal and vertical linearity with horizontal linearity 0.1% and vertical linearity 2%.
  • DAC?AVG ?DGS curves and defect echo help to evaluate defect equivalent calculation.
  • Simultaneous display of high resolution A-scan and B-scan waveform.
  • Four ways to present waveform: positive half-wave, negative half- wave, full wave and radio frequency.?
  • Automatic gain adjustment, defect equivalent calculation and peak memory function.
  • Two individual gates setting and alarming function.?
  • Gate measurement includes echo amplitude, beam path, depth, projection and so on.
  • Waveform freeze available?in full ,peak, comparative and envelope ways.
  •  50 detecting channels are available with separate detecting parameters and DAC (Distance Amplitude Correction) curves in every channel.
  •  Adjustable high performance square wave pulse generator
  •  Three detecting modes(single-probe, dual crystal probe and transmission) with automatic calibration function.
  • Connected to PC via USB interface with advanced software for data analysis and management.
  • Super large memory, 1000 waveform and 4X2000 frame dynamic waveform diagrams can be stored, with the function of storage, checkout and review of channel, waveform, dynamic records.
  • Flaw detection report printable.

Spesification

 

Technical Specification

Operating temperature

-10?~+50?

Storage temperature

-20?~+60?

Language

English/Chinese/Spanish selectable

Probe socket

LEMO or BNC

Battery (mAh)

2x3.7V 5000mAh

Battery working time

>8h

Charging time (h)

<8h

Power adapter Input

100-240~50/60Hz

Output

9V DC/3A~4A

LCD

Color transmission TFT, 640x480

Dimension (mm)

177X255X51

Weight (g)

1200

 

Basic

Receiver

Measuring unit

mm/inch/μs

Gain (dB)

0~110

Scanning range (mm)

0-10000

Bandwidth (MHz)

0.5~15

Sound velocity (m/s)

600-16000

Rectify

Positive half wave, negative half wave, full and RF

P-delay (μs)

-1.000~750.000

Vertical linearity accuracy

±2%

D-delay (μs)

-20~+3400

Amplifier resolution (dB)

±1

Test mode

Pulse-echo, dual and through transmission

Rejection (1%)

Linear, 0~80% of the full screen

Scanning mode

A scan and B scan, displaying both simultaneously

Sampling frequency (MHz)

80

Pulse generator

Crosstalk rejection (dB)

≥80

Pulser (V)

Square pulse

Dead zone (μs)

≤10 (related with transmitting)

Transmitting voltage

100~400(V) variable in steps of 10V

Dynamic range (dB)

≥40

Transmitting pulse width (ns)

75/100~500 variable in steps of 50ns

Instant resolution (dB)

≥32

Damping (Ω)

50/100/200/500

Time base linearity

<±0.2% full screen

Pulse repetition  frequency (Hz)

10~1000

Sensitivity leavings (dB)

≥62 

 

Measurements and others

Data management, communication and print

Gate

2 indepent gates

Data storage
Data management

50 channels

Testing position

Edge, Peak value

1000 wave images (including 980 A scan images and 20 B scan images)

Gate measurements

Echo amplitude, Sound path, depth, projection etc.

4x2000 dynamic wave image

Freeze

Freeze waveform, peak value, comparative and envelope

Store, review or replay the channels, waves

AVG equivalent calculate

Calculate the flaw equivalent according to the flaw echo and AVG curve

All the data can be stored to PC or flash disk

DAC flaw evaluating

Make flaw evaluation according to flaw echo and DAC curve

Communication

Communicate with PC via USB interface

Gate logic

Off, measurement, gate positive wave alarm, gate negative wave alarm

Printing

Print report

Gate alarm

off, anytime, hold for 0.2s, 0.5s, 1s and 2s, lock

Outout port

Alarm

on/off

USB OTG port

USB 2.0 device connected with PC
USB 2.0 host connected with flash disk or printer